Technicians in charge: Maite Simón and Andrés Gómez
Scientist in charge: Martí Gich
The Scanning Probe Microscopy (SPM) Lab provides state-of-the-art technologies that allow for the characterization of nanometric materials through the creation of reliable, fast and low cost topographic images as well as advanced modes.
The service has produced a total of around 3000 images corresponding to 45 users, 92% of which were external users).
Micro/Nanostructure Engineering of Epitaxial Piezoelectric α-Quartz Thin Films on Silicon
Qianzhe Zhang, David Sánchez-Fuentes, Rudy Desgarceaux, Pau Escofet-Majoral, Judith Oró-soler, Jaume Gázquez, Guilhem Larrieu, Benoit Charlot, Andrés Gómez, Martí Gich, and Adrián Carretero-Genevrier
ACS Appl. Mater. Interfaces 2020, 12, 4, 4732–4740, 10.1021/acsami.9b18555
Soft-Chemistry-Assisted On-Chip Integration of Nanostructured α-Quartz Microelectromechanical System
Claire Jolly, Andres Gomez, David Sánchez-Fuentes, Dilek Cakiroglu, Raïssa Rathar, Nicolas Maurin, Ricardo Garcia-Bermejo, Benoit Charlot, Martí Gich, Michael Bahriz, Laura Picas, Adrian Carretero-Genevrier
Advanced Materials Technology 2020, 6, 2000831, 10.1002/admt.202000831
Reply to the “Comment on the publication ‘Ferroelectricity-free lead halide perovskites’ by Gomez et al.” by Colsmann et al.
Andrés Gómez, Qiong Wang, Alejandro R. Goñi, Mariano Campoy-Quiles and Antonio Abate
Energy Environ. Sci., 2020, 13, 1892-1895, 10.1039/D0EE00880J